Used TEL / TOKYO ELECTRON P-8XLm #293809338 for sale

TEL / TOKYO ELECTRON P-8XLm
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8XLm
ID: 293809338
Wafer Size: 8"
Prober, 8".
TEL / TOKYO ELECTRON P-8XLm is a high-performance prober with automated alignment and pattern recognition capabilities. It is used to inspect and analyze wafers and other delicate parts with the utmost accuracy. This prober features a large working area and a highly accurate 8-axis stage to provide precise positioning and scanning capabilities. TEL P-8XLm also depicts a rapid sampling rate, allowing for fast throughput and minimum probing time. This prober also offers excellent repeatability for fine probing and lithography operations. TOKYO ELECTRON P 8 XLM's advanced vision and pattern recognition technology allows for low-stress membrane probing and more accurate alignment. This makes it a great choice for those working with advanced semiconductors. Moreover, the prober is suitable for a wide range of probing applications such as thin-film analysis, optical and electrical testing, and circuit isolation. P-8XLm is manufactured using cutting-edge robotics and precision laser-based sensors. This allows users to move, modify and detect patterns quickly and accurately. Additionally, it is equipped with a high-resolution, high-speed imaging camera to enable accurate scanning of micro features. The camera provides clear images, even with challenging metrology tasks and difficult to inspect high aspect ratio components. TEL / TOKYO ELECTRON P 8 XLM is a versatile prober and offers a variety of substrate sizes including 4, 5 and 6 inches. Its high speed motion capability and minimal probe movement ensure higher yields and reduced particle contamination. This prober also provides comprehensive customization and analysis capabilities via a wide range of accessories and add-ons. Furthermore, the user-friendly interface and automated operations makes it easy to use and maintain. P 8 XLM gives users a top-of-the-line, high-performance solution for precision aperture metrology.
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