Used TEL / TOKYO ELECTRON P-8XLm #9261696 for sale

TEL / TOKYO ELECTRON P-8XLm is a professional prober designed for contact probing and electrical testing of semiconductor devices such as ICs. It features a high-precision XYZ stage with advanced motion control and a highly-integrated platform with a unique multilingual Simplified User Interface (SUI) and robust hardware. This powerful equipment offers a fast, accurate and repeatable probing solution that can be configured for both light and heavy probes. TEL P-8XLm adopts a unique integrated XYZ motion platform with dual axis and an outer 500mm X 200mm stage for fast and easy setup. The 1um step resolution allows high-precision low-force probing with no separate fine alignment needed. The prober includes a lightweight probe head with a wide range of adjustment abilities, including a 3-axis locking frame that allows for a variety of probe angles. The prober also features a powerful and fully-integrated SUI, which provides an intuitive interface for both setup and control. The system is available with multiple languages and is designed for reliable and repeatable operation with sophisticated automated step-by-step probing routines including automatic tip loading and unloading. It also features a troubleshooting wizard to diagnose unit and tool errors with detailed analysis of the issue at hand. The prober also includes a drosselkamm, a probe tip conditioner that is specifically designed to enhance the contact characteristics of the probe tip and improve accuracy and repeatability, as well as reduce wear over time. TOKYO ELECTRON P 8 XLM is also compatible with advanced image processing, edge recognition, and in-circuit testing (ICT). Additionally, the machine is available with a variety of probe cards and can be customized to meet specific customer application needs. TOKYO ELECTRON P-8XLm's smart and intuitive software allows for fast setup and precise operation, making it the ideal prober for high-precision probing and testing applications. Its integrated XYZ platform and multilingual SUI make it easy to operate, simplify setup and allow for faster speeds and higher accuracy. Additionally, its drosselkamm enhances performance and extends the life of the probe. Its compatibility with various types of probe cards makes it a great choice for many testing requirements.