Used TEL / TOKYO ELECTRON PR200Z #9146543 for sale

TEL / TOKYO ELECTRON PR200Z prober is a fully automated, high-precision, wafer probing equipment, capable of testing a wide variety of semi-conductors and integrated devices. The system has a 25µm xy linear stage, achieving automatic minimum probing force control and contact adjustment. It is capable of analyzing and testing a wide variety of semiconductor devices, including but not limited to, DRAMs, SRAMs, flash memories, power devices, analog and digital devices. TEL PR200Z Prober is equipped with an efficient and reliable Auto Load/Unload (A/U) unit that provides automatic supply of test wafers to the prober. This machine features an integrated X-Y motion control and an efficient insertion process. The prober can be loaded with wafers up to 200mm diameter, making it an ideal choice for testing large wafers. The probe is designed to be used in a clean room environment, meaning that only clean room specific cleaning and safety protocols must be observed in order to ensure the proper operation of the prober. Furthermore, TOKYO ELECTRON PR200Z prober is built with advanced technologies including Automatic Reticle Change (ARC) and Dual-Axis Plate Correction (DAPC). With these technologies, the prober can keep its high accuracy of 3μm or less. Thanks to PR200Z Prober's tightly-integrated auto-load/unload (A/U) tool, it is capable of automatically placing wafers, executing tests and collecting data. The asset is equipped with a high-resolution camera for measuring and analyzing dimensions of the devices on the wafer substrate. In addition, an accurate vision alignment model is available to determine the exact location of the wafer substrate on the prober. This prober offers a robust software equipment for automated testing and data analysis. It also provides a wide selection of custom programs that allow users to customize their own testing and evaluation methods. These programmable parameters include Test Probe Configuration, Delay Time, Forcing Force, and Number of Measurements. TEL / TOKYO ELECTRON PR200Z prober offers robust technical capabilities for high-precision testing of semiconductor devices. Its combination of an automated loading system, a high-resolution camera and precise motion control enables TEL PR200Z to accurately and consistently test a wide variety of devices. With its programmable features and automated capabilities, this prober is an ideal choice for both research and development of semiconductor devices.