Used TEL / TOKYO ELECTRON PR200Z #9157625 for sale

TEL / TOKYO ELECTRON PR200Z is a prober used to make measurements on semiconductor wafers and die. It is a non-contact imaging equipment that uses a high-resolution optical microscope to rapidly capture high-resolution images of wafer bump analysis and defect detection. The prober is designed to be used in production processes and in research and development laboratories. TEL PR200Z Prober has a large 200mm wafer table, an advanced, integrated vision system with a CCD camera and dedicated application software, and a high-accuracy motion controller to ensure precise wafer movement. It is equipped with eight independent motorized stages and an XYθ table, providing various options for wafer alignment. The prober has adjustable coarse/fine knobs for precise positioning, a positioning light and a spindle speed indicator for easy access to the sample. It also includes an optical character recognition (OCR) unit that can be used to identify visually-importable text on the wafer. TOKYO ELECTRON PR200Z Prober is designed to provide efficient throughput and high performance. It uses a 20nm repeatability for fast scanning of wafers over large areas. It also has a quick measurement mode to accelerate the mapping process, and has programmable edge detection functions to quickly identify and measure bumps and bumps at the same time. In addition, PR200Z Prober is equipped with a variety of advanced features such as an auto focus machine, enhanced magnifying glass, auto-alignment and wobble correction, die review, one-click compensation, and dual-channel image stitching, which allow for quick and accurate scanning and analysis. TEL / TOKYO ELECTRON PR200Z Prober is compatible with TEL comprehensive range of integrated EDA (probing and characterization) software, which automates the test process to ensure accurate and repeatable results. The EDA software includes functions for setting up and executing tests, analyzing results, and generating reports. It includes measurement capabilities for a wide range of semiconductor structures, such as photolithography, transistors, resistors, etc. The prober is an economically priced solution for reliability testing of components in research and development laboratories.