Used TEL / TOKYO ELECTRON PR300Z #293592922 for sale

TEL / TOKYO ELECTRON PR300Z is an automated prober designed for the electrical testing of semiconductor devices. It is an essential tool for the evaluation of integrated circuit layouts and the fabrication of wafers. With its advanced automatic substrate loading and electrical probing capabilities, TEL PR300Z makes the process of testing integrated circuits (ICs) easier and faster. This ensures that chip designers and manufacturers can quickly and reliably evaluate their products, thereby optimizing crucial production processes. TOKYO ELECTRON PR-300Z features a fully integrated equipment that allows for the parallel testing of multiple substrates, which can be accommodated on an M8-type, single-end prober. The system is equipped with an automated load port and features an end-effector turret that facilitates the fast exchange of substrates. This, combined with the unit's load port monitoring and real-time data feedback, ensures a streamlined and automated process. PR300Z also boasts a high-resolution, pattern-recognition, contact-probability feature, which allows for accurate placement of testing needles and alignment between the spindle and probing needles. This guarantees enough contact with IC pins, even when the chips under test are small or have densely packed pins. This high accuracy is essential in ensuring reliable and repeatable data capture. In terms of performance, TEL / TOKYO ELECTRON PR-300Z has a high throughput rate, with a maximum probing speed of 500kHz. This is done by automatically readjusting the spacing between needles to match the spacing of the pins on the ICs. Furthermore, TOKYO ELECTRON PR300Z is equipped with two linear and one angular acceleration load/unload motion. This ensures fast and reliable handling of the wafers, allowing for quick turnaround times. TEL PR-300Z also features improved noise and repeatability factors, thanks to its high-speed processing capabilities. Its advanced diagnostics software tools further enhance the machine's performance and reliability. This allows users to quickly identify issues, diagnose problems, and perform corrective action if needed. Overall, PR-300Z is an advanced automated prober designed to maximize the performance and reliability of IC evaluation processes. With its high accuracy, high speed, and advanced diagnostics capabilities, it ensures efficient and repeatable testing performance for any application.