Used TEL / TOKYO ELECTRON PR300Z #293664957 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
PR300Z
ID: 293664957
Wafer Size: 12"
Vintage: 2009
Carrier-less BEOL Cleaning system, 12" (3) Modules: Process, chemical and transfer YASKAWA ERCR-NS00-A210-E YASKAWA Motoman YR Series robot Miscellaneous parts CE Marked 2009 vintage.
TEL / TOKYO ELECTRON PR300Z prober is a high-performance, full-motorized wafer prober. It features highly accurate metrology capabilities to perform consistent and precise wafer testing over a long-term cycle time. It supports a variety of wafer sizes, ranging from 6-inch pieces to 12-inch pieces, with a range of pattern features and edge finishes. Its main components consist of a wafer pick and place unit, a prober stage, an auto focus equipment, a prober head, and an atmospheric pressure (AP) system. The wafer pick and place unit features an automated "soft vertical pick" feature that enables manipulation of the wafer without damaging its edges, and a high-speed, high-precision autocentering feature. The prober stage is controlled by Computer Numerical Control (CNC) technology and allows the user to precisely control the motion of the wafer throughout the testing process. The auto-focus unit eliminates any tilting and other surface irregularities, ensuring optimal wafer contact and minimized contact point waviness. The prober head allows for fast, repeatable precise probing and testing, eliminating any significant drift from the test results. Lastly, the atmospheric pressure machine provides clean air at a constant pressure to the prober head, allowing for accurate and stable probing over extended use periods. TEL PR300Z prober is equipped with a number of built-in features and capabilities, including low-variable high sampling, a motorized wafer placement tool, a computer interface, a customizable testing program, and low-noise operation. It is also well suited for automated testing and complex testing requirements, as it incorporates high-end vision-controlled robot systems and advanced control algorithms. Its smart failure diagnosis capabilities quickly detect and alert users of any critical failures or defects, enabling quick resolution and accurate test results. TOKYO ELECTRON PR-300Z prober offers a superior combination of performance, durability, and reliability for wafer test and production needs. Its robust design ensures that it can handle unexpected wafer motion, vibration, and shock, enabling efficient production and testing cycles. In addition, it offers a wide range of safety features, including electrical, fire, and other safety protections that keep users safe and their equipment secure and running properly. Overall, TOKYO ELECTRON PR300Z prober is an integrated and precise prober asset designed to optimize the performance of high-end wafer testing applications. With its high accuracy, low-noise operation, numerous built-in features, and safety protections, it is ideal for researchers and production professionals looking to ensure precise and accurate results for their wafer testing needs.
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