Used TEL / TOKYO ELECTRON PR300Z #293821718 for sale

TEL / TOKYO ELECTRON PR300Z is a state-of-the-art prober designed specifically for semiconductor wafer testing. The prober is capable of testing top-level high power semiconductor devices such as transistors, diodes, and BJTs for single, double, and triple level wafers. TEL PR300Z has a maximum wafer size of 30mm, a maximum wafer thickness of 2.5mm, and a total thickness of 1.6mm. It has a high-sensitivity wafer edge detector for accurate aligning of wafers. TOKYO ELECTRON PR-300Z features a 200nm vacuum-sensing detection accuracy, along with an advanced thermal imaging system that can quickly identify temperature shifts, cracks, and missing components on the wafer. Its patented Thermal Validation System (TALV) provides a thorough on-site check of wafer temperature, allowing users to make sure their device is performing properly. The TALV also enables the implementation of a pilot wafer run in the same batch to confirm the suitability of a process setting before production is begun. The prober is highly effective in proactively detecting small defects and flaws on the wafer, thus allowing for quick intervention and resolution. TOKYO ELECTRON PR300Z also features an adjustable profile function, which allows users to quickly adjust the prober's probe force, compensation pressure, and contact force. This feature helps ensure repeatable contact force regardless of differences between wafers, enabling consistent testing. Furthermore, PR300Z has a wafer patterned test signal scanning capability, allowing for process validation testing of a wide range of functions. PR-300Z is a highly reliable and advanced prober with a wide range of features that make it suitable for a variety of semiconductor wafer test applications. It is easy to use and maintain, making it a great choice for any semiconductor wafer testing needs.