Used TEL / TOKYO ELECTRON PR300Z #9150962 for sale

TEL / TOKYO ELECTRON PR300Z Prober is a fully automated, medium-format semiconductor device probing solution for both wafer and package testing. This prober offers an efficient and accurate process for recognizing, testing, and characterizing test devices on a range of production wafers and packages. TEL PR300Z features a large testing area and a robust architecture that is designed to handle extreme temperatures and pressures for accurate device measurements. TOKYO ELECTRON PR-300Z also features a twin-arm robot that is capable of performing a variety of functions such as die detection, handler transport, and wafer translation. In addition, the prober is equipped with advanced measurement hardware including an optical microscope, high-precision electrical probes, and highly sensitive capacitance measurements for quality testing. This allows the system to precisely test and characterize different device structures and to monitor their performance. TEL / TOKYO ELECTRON PR-300Z also features several automated wafer probing programs such as die recognition, test accuracy management, and test device capability measurements. These automated programs further bolster the accuracy and speed of testing as well as reduce operator fatigue. TEL PR-300Z can also simulate both digital and analog circuits so that the impacts of different environmental conditions can be accurately tested. This provides a comprehensive overview of the device's performance across different conditions. PR300Z includes a user-friendly software interface that allows operators to easily adjust testing parameters and quickly generate test reports. Furthermore, the prober includes built-in data collection and reporting capabilities that further facilitate the process of identifying and resolving test issues. This data can also be used to improve the efficiency of future test programs. Overall, PR-300Z is an advanced medium-format prober that can be used to accurately and quickly test a wide range of semiconductor devices. The prober's robust architecture and various automated features ensure a reliable and efficient process for testing each device. Additionally, the integrated software allows operators to easily configure and run tests, collect data, and generate test reports. This makes TOKYO ELECTRON PR300Z an ideal prober for device testing across a range of industries.