Used TEL / TOKYO ELECTRON PR300Z #9251838 for sale

TEL / TOKYO ELECTRON PR300Z is a prober designed for semiconductor device performance testing. It is a highly accurate and reliable instrument for testing various parameters such as resistance, capacitance, RF signals, and other electrical characteristics. TEL PR300Z is equipped with a 6-inch stage for up to 4-inch wafers, as well as a powerful motor that can provide up to 1.5 m/s of probing force. TOKYO ELECTRON PR-300Z is designed to accurately detect and measure the electrical characteristics of semiconductor devices. It can quickly measure a variety of electrical characteristics such as voltage, current, resistance, capacitance and RF signals. The accuracy of the instrument is ±0.1% of the full range, so it can accurately measure characteristics of semiconductor devices with little error. PR-300Z can be used in a wide variety of applications. It is used to measure the parameters of semiconductor devices on wafers, perform process control in semiconductor fabrication processes, and test functional devices on board. It is also used in failure analysis, product qualification, and designing and evaluating semiconductor devices. It can also be used for research and development purposes. In terms of its features, TEL PR-300Z comes with an advanced optical probe alignment system for accurate measurements and improved accuracy. It is also equipped with high-precision vacuum pads for increased grip on the wafer during testing or probing. Moreover, it is equipped with an advanced auto-feed system for easy insertion of wafers and increased throughput. Additionally, it has an RF Shielded Environment to protect from EMI and other environmental noise. TOKYO ELECTRON PR300Z is an extremely versatile instrument for testing semiconductor devices for a variety of applications. It is reliable, accurate, and capable of quickly measuring parameters of semiconductor devices. It also has several advanced features, such as optical probe alignment, vacuum pads, and an auto-feed system. These features make it a great choice for testing and measuring semiconductor devices.