Used TEL / TOKYO ELECTRON Precio Nano #293730256 for sale
URL successfully copied!
Tap to zoom
ID: 293730256
Wafer Size: 12"
Vintage: 2010
Prober, 12"
FOUP Loader
CIM: SECS, GEM
Handler system
2010 vintage.
TEL / TOKYO ELECTRON Precio Nano is a prober designed for testing high-performance semiconductor devices. The prober is able to measure the electrical characteristics of single and multi-die devices with a wide range of geometries. It offers a wide range of testing capabilities, with a focus on high throughput, low cost, flexibility, and accuracy. TEL Precio Nano has a modular design, with multiple test ports consisting of double-ended probes available for various device types and configurations. This allows the operator to configure the prober to meet the specific requirements of each application. The prober supports single and dual die measurements, allowing for efficient testing of both small and large devices. It features built-in probes that are designed for low capacitance to minimize any parasitic capacitance between test nodes. The prober is powered by an automated measurement equipment that is capable of handling complicated test scripts and test conditions. This system is capable of executing multiple protocols simultaneously, allowing for efficient testing of a wide range of devices. The unit is designed to automatically detect the IC type and perform the appropriate tests accordingly, reducing the time and effort required by the operator. TOKYO ELECTRON Precio Nano is a high-performance prober that is designed for efficient testing of semiconductor devices. It features a modular design and a multiple port structure, making it easy to configure the prober for various test requirements. It has a fast, accurate automated machine that is capable of executing multiple test protocols. It is an ideal tool for testing high-performance devices with a wide range of geometries and configurations.
There are no reviews yet