Used TEL / TOKYO ELECTRON Precio Octo #293768200 for sale

TEL / TOKYO ELECTRON Precio Octo is an advanced wafer prober that is based on the flat-panel architecture. It features a fully integrated multi-plane Load Lock equipment, two-axis positioner, and fully automated control and monitoring capabilities. This unique system is capable of high throughput testing of integrated circuits and semiconductor devices. It is designed for ultra agile operations and highly efficient probing. The unit is equipped with a dual-axis, precision positioning mechanism that is capable of accurately positioning small devices with sub-micron accuracy. The motion controller unit ensures that positioning of the probe with respect to the device under test is always accurate and consistent. The integrated Load Lock machine allows for the rapid exchange of probes and devices, allowing the tool to operate more efficiently and with reduced cycle times. The asset also incorporates an Auto-Inspect function which consists of an array of CMOS sensors and a camera for automatic inspection. This function allows the model to automate five key processes - manual probe alignment, scan imaging, wafer contamination check, wafer mounting, and motorized final alignment. The Auto-Inspect feature significantly reduces the time required for probe alignment, significantly increasing throughput. The equipment is further equipped with advanced TEL proprietary control and monitoring software, including a fully automated calibration tool. The calibration tool eliminates the need for manual calibration and ensures repeatability and consistent results. The software is completely configurable and can be customized to the specific needs of a specific application. The system also includes a powerful data logging unit which can record and store detailed measurements for future review and analysis. TEL Precio Octo is one of the most advanced and reliable wafer probers on the market. Its fully automated control and monitoring capabilities, coupled with its robust and reliable design, make it an ideal choice for high-throughput testing of integrated circuits and semiconductor devices. It is well suited for a wide range of applications and can handle a large variety of tasks, such as probing, characterisation, parameter measurement, wafer contamination checks and wafer mounting.