Used TEL / TOKYO ELECTRON Precio Octo #9151753 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

TEL / TOKYO ELECTRON Precio Octo
Sold
ID: 9151753
Prober.
TEL / TOKYO ELECTRON Precio Octo prober is a equipment designed to monitor and test semiconductor wafers. The system uses a series of probes to measure various electrical parameters on the wafer surface, such as Vd/Vg, leakage current, etch current, and film thickness. The probe is designed with a patented contact structure that makes it possible to accurately analyze and measure the wafer in a reliable and repeatable manner. The prober consists of three main components: a table, a wafer chuck, and the probes. The table is used to securely hold the wafer chuck and stabilize it while testing. The wafer chuck is a plate made up of four vertical rods, which hold the wafer in place during testing. Depending on the wafer type, the chuck can be adjusted to different heights so that the prober can cover the entire wafer. The probes are attached to the wafer chuck and are designed to be very precise in order to accurately measure the test parameters. TEL Precio Octo Prober also features a fully automated unit. It uses a sensor and a motion control machine to accurately move the wafer chuck and the probes to the desired position on the wafer. This ensures that each wafer is tested in the same way, which helps to reduce any variation between wafers. The prober also features a touch-screen interface, which makes it easy for operators to set up and operate the tool. The asset can be programmed to run specific tests on different types of wafers, meaning that the prober can be used for testing a wide variety of wafers. It also features an internal memory, which can store up to 100 programs, making it possible to store all the necessary test parameters for a particular wafer type. TOKYO ELECTRON Precio Octo Prober is a reliable and precise model for testing and measuring semiconductor wafers. It provides a cost-effective and accurate way to monitor any changes in the electrical properties of the wafer surface. By using a combination of probes and an automated equipment, the system is able to accurately measure any desired parameters with repeatability.
There are no reviews yet