Used TEL / TOKYO ELECTRON Precio Octo #9362671 for sale
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ID: 9362671
Wafer Size: 8"
Vintage: 2011
Prober, 8"
Golden TRX hot and cold chuck top assy
Chiller: C255
Temperature: -55 ~ +200
Right side single top loader
WAPP
2011 vintage.
TEL / TOKYO ELECTRON Precio Octo is a specialized Semiconductor Metrology and Inspection Prober. It is specifically designed to inspect semiconductor wafers and components with high accuracy. TEL Precio Octo is equipped with three different technologies for semiconductor measurement: Optical Metrology, Electron Paramagnetic Resonance (EPR) measurement, and Magnetic Force Microscopy (MFM). Optical Metrology allows for precise measurements of features on the wafer using advanced optics. With TOKYO ELECTRON Precio Octo's Long-Wave Infrared (LWIR) equipment, it is capable of measuring small micro-geometrical structures with an accuracy of 5nm or better. This technology is especially useful in high density measurement applications, where precision is essential. The EPR measurements are essential for determining the electrical properties of a material. Precio Octo utilizes a Radio-Frequency UFH probe to measure the electrical and optical properties of the material at different temperatures with a highly accurate accuracy of 2 microns/2%. This system is capable of accurately measuring the dopant concentration, defect density, diffusion length, and other electrical properties. The MFM technology provides the most detailed image of the wafer's surface. TEL / TOKYO ELECTRON Precio Octo's MFM unit has a resolution of 10-20nm and a measurement accuracy of 3nm, allowing for ultra-precise measurements to be made. With its force range of 0.25-25N, the machine is capable of accurately measuring the surface topography of the wafer. TEL Precio Octo is a highly advanced semiconductor metrology and inspection prober, designed for inspection and measuring applications with the highest accuracy requirements. Its combination of advanced optical metrology, EPR, and MFM technologies provides an unparalleled level of precision, allowing users to reliably inspect and measure semiconductor components.
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