Used TEL / TOKYO ELECTRON Precio Octo #9404794 for sale

TEL / TOKYO ELECTRON Precio Octo is a semiconductor prober manufactured by TEL (TOKYO ELECTRON), a leading supplier in the semiconductor industry. TEL Precio Octo is a fully automated wafer probe test equipment designed for a wide range of high-end semiconductor testing applications. The system is capable of running the latest advanced test technologies such as advanced packaging tests and test techniques used in 3D chip architectures. TOKYO ELECTRON Precio Octo is designed to provide an efficient and reliable test solution. The unit utilizes an automated handler to load, unload, and process substrates and its precision automated probers can work with a range of package types and materials. The machine also features an over-the-air network connectivity that provides secure data access and remote control of various tool features. Furthermore, the asset is capable of simultaneous testing of up to 8 products with up to 2,000 I/Os (input/output pins). Precio Octo is equipped with advanced equipment for high-precision probing. Its high-precision motion platform offers the best vertical and lateral accuracy for true-to-spec test probe placement and movement. The model is also equipped with a very high-precision, high-speed movecore* technology that enables secured and accurate test probe movement with minimal oscillation and impact. Moreover, highly reliable clean chuck technology helps to maximize up time. TEL / TOKYO ELECTRON Precio Octo also includes SESA* Micro-Testing and SESA Accelerated Micro-Testing, which allows for low-pressure and high-speed probing. Both of these technologies provide ultra-fast testing while still providing intrinsic test accuracy and repeatability. In addition, TEL Precio Octo comes with a variety of advanced analysis and diagnostic tools such as advanced web-based reports, pattern recognition, and temperature-independent adaptation algorithms. Overall, TOKYO ELECTRON Precio Octo is a reliable and accurate equipment that can be used for a wide variety of semiconductor testing applications. It is designed to provide maximum efficiency and reliable testing with minimal setup and setup time. In addition, the system features a variety of advanced features that provide improved test accuracy and repeatability.