Used TEL / TOKYO ELECTRON Precio #293630294 for sale

TEL / TOKYO ELECTRON Precio is a multi-function Prober that is used in the fabrication and testing of semiconductor devices. The Prober is a high resolution advanced 3D profilometer developed by TEL to provide advanced surface profiling and defect location. It features advanced non-contact optical detection technology to allow accurate measurement of the device surfaces and provide nanometer-scale surface profiling data. TEL Precio features a large range of automated measurements, including advanced surface profiling; three-dimensional defect location and analysis; and unique stress and topography mapping. Its advanced 3D profilometer system can measure across the entire surface of a device and to nanometer precision. This allows for analysis of irregularities in the surface, so that any problems can be identified and corrected. TOKYO ELECTRON Precio also provides fast defect location and analysis. By detecting defects in topography and contours, it can assist with the detection of bonding false contacts and other problems. It also allows for analysis of any ruggedness changes in the surface, thus providing a reliable means of determining very small changes in the device surface. In addition to these features, Precio can also provide high accuracy measurements of shapes and dimensions of small features, making it ideal for nanoscale research. It can also be used to measure field-dependent stress and strain, making it suitable for high resolution measurements in materials characterization. Besides its numerous features, TEL / TOKYO ELECTRON Precio can also be used for automated processes. It includes integrated controllers and PC software, so users can automate different processes, improving efficiency and reducing user error. This makes it suitable for high-volume production applications. TEL Precio is a versatile tool with a range of features that makes it perfect for advanced surface profiling, materials characterization and high volume production. It is one of the most advanced 3D profilometers on the market, allowing for precise and reliable measurements of semiconductor devices.