Used TEL / TOKYO ELECTRON Precio #293651310 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
Precio
ID: 293651310
Wafer Size: 12"
Vintage: 2009
Prober, 12" Hot chuck 2009 vintage.
TEL / TOKYO ELECTRON Precio is a compact Prober for semiconductor wafer testing applications. It is designed for fast, precise and repeatable sample handling, making it suitable for process control, fault isolation and yield improvement. TEL Precio utilizes a precision wafer mapping equipment and high resolution metrology performance to accurately measure small devices and materials. TOKYO ELECTRON Precio offers an extensive set of advanced features and benefits, including high-speed, high-resolution metrology, an integrated data acquisition system with advanced software, and a range of analysis and diagnostic functions. It is capable of rapidly acquiring and analyzing data required for process control, fault isolation, and yield improvement. The high-speed, large range, high dynamic range scan algorithms enable fast wafer mapping and probing. The high performance laser interferometer provides extremely accurate wafer mapping. Precio also features a high-end optical microscope for automated visual inspection. This inspection can detect the presence of fractures, presence of defects, presence of particles, presence of voids, etc. The microscope can magnify up to 1000x with a 3-megapixel sensor. The microscope also has advanced image capture and analysis functions to quickly identify and analyze defects. Further, the unit is designed to reduce particles levels by using a low hCl gas supply machine, which eliminates any need for filter changes or machine maintenance. Additionally, the tool comes with an advanced gas detection asset, which prevents contamination of the wafers during the process. In general, TEL / TOKYO ELECTRON Precio is a technological breakthrough when it comes to semiconductor testing. It features high speed, precision, and repeatability to maximize the efficiency and accuracy of the process. This makes it ideal for process development, process control, and yield improvement applications.
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