Used TEL / TOKYO ELECTRON Precio #293659609 for sale

TEL / TOKYO ELECTRON Precio is a powerful, versatile semiconductor prober platform which offers high yield, accuracy and repeatability for characterizing electrical and physical properties of semiconductor devices. It is particularly suited for fine-pitch probing and advanced wafer metrology. TEL Precio utilizes an innovative design which works on a low mass, high rigidity system. It is equipped with temperature monitoring and control functions to ensure temperature stability and maintain a high level of repeatability. Probes can be manipulated through a mechanical system that is capable of controlling their trajectory and sense signals. A combination of high-speed digital effects and advanced signal processing allows fast, accurate and repeatable data analysis. The prober has several types of probes, including contacting and non-contacting types. Contacting devices are generally used for contact resistance measurements, while non-contacting probes offer excellent performance in contactless devices. These probes can also be paired with a variety of tools, such as laser interferometry, optical metrology and fluorescent microscopy, to provide a top-down view of complex structures. The platform is equipped with a calibration stage, which can be used to ensure the accurate and repeatable positioning of probes. TOKYO ELECTRON Precio also includes a library of sophisticated analysis software, which can be used to analyze the results obtained by the prober and display them in a variety of graphical formats. Built-in application specific libraries are available for characterization purposes and to perform device simulations. The software is designed to be user-friendly, allowing for easy data sharing and visualization. In summary, Precio is a sophisticated, robust prober platform offering high precision, repeatability and accuracy for semiconductor probing and characterization. Its mechanical design, advanced signal processing capabilities, temperature control and application specific libraries enable fast and accurate data analysis. The platform is ideal for fine-pitch probing, device characterizations and advanced wafer metrology.