Used TEL / TOKYO ELECTRON Precio #293748590 for sale

TEL / TOKYO ELECTRON Precio is a prober produced by the Japanese semiconductor testing and fabrication equipment manufacturer, TEL. The prober is used for the testing and evaluation of semiconductor materials and devices. Its primary function is to measure the electrical characteristics of the semiconductor components, such as the resistance, capacitance, and power transformation between the component and a substrate. The prober is also used to test other electrical properties, such as noise immunity and signal propagation. TEL Precio is a semiconductor multi-probe station and uses a column structure and X, Y, Z-axis coordinate system for testing. The multi-probe station is equipped with advanced software for the programming and control of the testing parameters and the probes. For testing, the probes are first positioned on the component or device. The component or device is then positioned on the substrate and the measurement is done by applying a signal voltage to the component. The probes then measure the current and signal changes during and after the signal application. TOKYO ELECTRON Precio is designed for high-speed testing applications and it can test simultaneously up to eight different components. The multi-probe station is capable of accurately measuring at frequencies up to 500KHz. The built-in self-test option allows for verifying the calibration of the prober before the tests are performed. Precio has an easy-to-use graphical user interface, with an optimized operating system, to make the operation quick and efficient. The multi-probe station is portable and can be placed in a small space in the production site. The system requires little maintenance and is easy to set up. TEL / TOKYO ELECTRON Precio is a reliable, efficient, and cost-effective solution for testing and evaluating semiconductor materials and devices. It offers high-speed measuring capabilities at a fraction of the cost of conventional, manual testing systems. The prober is also versatile and can be used for testing different types of semiconductor components and devices.