Used TEL / TOKYO ELECTRON Precio #293757966 for sale

TEL / TOKYO ELECTRON Precio
Manufacturer
TEL / TOKYO ELECTRON
Model
Precio
ID: 293757966
Wafer prober.
TEL is a prober used for evaluating the electrical characteristics of semiconductor devices. The probe is designed for making contact resistance measurements which, in turn, are used to assess a wide range of device parameters such as electrical breakdown voltage, current leakage, and other device performance criteria. TOKYO ELECTRON probe is designed for a variety of material surfaces including gold, aluminum and copper. The probe is designed to make contact with a device's surface with a special tip that conforms to the device and a socket that provides the electrical connection. The probe is placed onto the device, and then the electrical current between the probe's tip and the socket is measured using a dedicated test system. Once the electrical resistance measurement is complete, the probe's results can be used to calculate the material's electrical parameters which can then be used to assess device performance. The accuracy of a TEL / TOKYO ELECTRON prober's measurements can vary depending on the specific device's characteristics but generally the probes offer excellent resolution and repeatability. The probe's price varies depending on the specific type of device that it is meant to evaluate. For example, a TEL prober designed for use with field-effect transistors is usually more expensive than one meant for use with standard MOSFETs. Prices can range from $500 to as high as $4000 USD. Overall, TOKYO ELECTRON probes provide an excellent solution for accurately measuring material resistivity and calculating device performance metrics. Their probes are accurate, reliable and offer a wide range of features and price points to suit any device evaluation needs.
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