Used TEL / TOKYO ELECTRON Precio #293770056 for sale

TEL / TOKYO ELECTRON Precio is a prober designed for wafer testing and production process monitoring. It is a highly integrated equipment that combines a wafer stepper, chuck and probe card assembly, PC-based control system, and a CCD optical inspection unit. The machine includes inspection and measurement capabilities for thin wafers up to 5 inches in diameter and enables accurate electrical, physical, and thermal characterization of devices. The tool features a proprietary prober design with an integrated stepping mechanism. This allows for precision movement of the wafer chuck and probe card, which permits precise measurements without external force, such as pressing the chuck against the wafer. In addition, the stepping mechanism also minimizes the number of times the wafer must be moved in order to measure the device parameters. The asset also features a highly accurate optical inspection model, allowing for microscope-like inspection of the wafer surface. The equipment has a resolution of 8 um, which can be used to inspect the device structures and other features, including thin-film layers, contact pads, solder joints, and more. Additionally, the system has a built-in thermal control feature, allowing users to precisely control the wafers' thermal environment during the measurement process. The PC-based controller provides easy-to-use interface with the necessary data inputs, allowing users to set up measurements and collect data quickly. It also provides a suite of analysis tools, allowing users to evaluate the data collected from the unit and produce highly accurate reports. The machine is designed to work with a variety of wafer types, including gallium arsenide (GaAs), silicon (Si), and indium phosphide (InP). With its flexible design, it is capable of measuring contact resistance, leakage current, device characteristics, thermal response, and other device properties. The tool's advanced design and software features result in highly accurate and reliable measurements.