Used TEL / TOKYO ELECTRON Precio #293802367 for sale

TEL (TOKYO ELECTRON) Prober is an advanced semiconductor testing tool for device characterization and production ramp testing. It is designed to measure and characterize semiconductor wafers using automated probing and measurement techniques. The Prober incorporates a number of features that make it a versatile and viable choice for a variety of manufacturing environments. The Prober is a benchtop machine that combines scanning stage motion control and precision metrology capabilities in a single work station. It is equipped with a high-resolution CCD camera with up to 12 megapixels of resolution. The Prober is based on an automated and flexible wafer stage layout. It has a range of interchangeable stages that allow for customized stage set-ups to accommodate different wafer sizes. The Prober is capable of probing up to 150 microns with a precision of 0.1 micron, which allows for accurate device and material characterization. The Prober comes with a variety of hardware and software options for device testing. It can be configured with up to three probes that can simultaneously measure different aspects of a device. The Prober is also equipped with a camera-based wafer inspection system to facilitate automatic device characterization and defect detection. Additionally, the Prober software enables application-specific test recipes and customized data processing, analysis, and display features. With the Prober, wafer testing is more efficient and accurate than traditional manual techniques. Notably, it enables fast and reliable characterization of a wide range of device types. It is also well suited for production ramp testing, as the system is capable of performing automated tests on wafers according to predefined test plans. As a result, the Prober contributes to improved device yields and efficiency overall. Overall, TEL / TOKYO ELECTRON Prober is an advanced testing solution for the manufacturing environment. The Prober is optimized for high-precision and cost-efficient semiconductor device characterization and production ramp testing. It can be customized to suit various requirements, and it helps to improve device yields and optimize efficiency.