Used TEL / TOKYO ELECTRON Precio #293814265 for sale

TEL is a semiconductor prober designed for the testing of integrated circuits and sub-assemblies. The prober comprises of a high performance electrostatic and mechanical chuck and probe tip that are designed to provide ultra high density probing capabilities and high throughput performance. The prober is also equipped with a range of dynamic features that are designed for maximum productivity and accurate probing operations. The built-in adjustable resolution and interpolation features provide the user with the flexibility to adjust probe speeds according to their needs. The prober has a dynamic pressure range of 0 to 1000 bar, a maximum interpolation speed of 10 nano increments per millisecond, an available wafer size range of 8 inch up to 200 mm and a tilt range of 0 to 4 degrees for maximum accuracy and repeatability. The design of the prober ensures that its accuracy and repeatability are kept within extremely tight tolerance levels. It is configured with both a high and low constant force mode that allow it to dynamically probe with multiple probes simultaneously. The kelvin contact method is employed by the prober to ensure the highest possible consistency and reliability throughout the probing process. The contact method relies on the measurement of current at the junction between the contact tip and the electronic device. This method ensures that multiple probes make simultaneous contact with the device during the testing phase. In addition, the contact pressure can be adjusted and controlled by an actuator to ensure an optimal contact force and accuracy level. The prober is also equipped with a range of built-in software tools and utilities that are designed to facilitate test and characterization operations. The advanced analyzing tools allow the user to measure a range of parameters such as signal integrity, version compliance and stability. Additionally, the software utilities provide the user with a variety of visualization modes, such as graphs, charts and tables, that are designed to assist in making more informed decisions regarding the probing process. TOKYO ELECTRON prober is an accurate and reliable prober that offers a wide range of features that are designed to streamline the testing and characterization of integrated circuits and sub-assemblies. The combination of these features ensures maximum accuracy and repeatability while reducing the risk of misprobing and potential damage to devices. The prober also allows users to easily adjust the probe pressure and motion to provide them with the highest level of accuracy and results.