Used TEL / TOKYO ELECTRON Precio #293818338 for sale

TEL / TOKYO ELECTRON Precio
Manufacturer
TEL / TOKYO ELECTRON
Model
Precio
ID: 293818338
Wafer prober.
TEL / TOKYO ELECTRON Precio is an atomic force microscope (AFM) designed to enable users to observe and measure the properties of a wide variety of devices and materials on a micro and nanometer scale. It is particularly adept at measuring various surface forces, surface topography, electrical and magnetic properties, and predicting how structures will react when exposed to different environmental conditions. TEL Precio is an advanced AFM equipment that includes a scanning system, a sample chamber, and a control computer. The scanning unit utilizes a non-contact scanning head, an integrated optical unit, and an optional touch/tapping view. This head houses a piezo-electric actuator that displaces the cantilever tip in the x, y, and z directions, allowing for imaging down to the nanometer resolution. The five-axis vision machine allows accurate alignment and enables observation from a wide range of angles. The sample chamber is tightly sealed off from the surrounding environment, helping maintain the stability of the environment and preventing sample contamination. TOKYO ELECTRON Precio is equipped with an advanced control computer for comprehensive sample and parameter analysis. It runs a proprietary image-processing software to extract pertinent information from the imaged surface data. This software can characterize isolated features and perform mechanical tests, which can be used to identify micro and nanoscale properties such as contact stiffness, adhesion, friction, and electrical/magnetic properties. Finally, Precio includes a novel self-locking force sensor, which can detect contact force down to 0.1 nN. This sensor can capture and analyze data about surface tension, adhesion, and structure at the nanoscale, providing the user access to powerful data about the properties of their sample. All in all, TEL / TOKYO ELECTRON Precio provides unmatched functionality and control over surface analysis on the micro- and nanoscale. With its five-axis vision, sample chamber, self-locking force sensor, and proprietary software, it allows users to safely and precisely measure surface properties, as well as create new and interesting patterns on their sample. This makes it an invaluable tool for research or production in the fields of semiconductors, microelectronics, and nanotechnology.
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