Used TEL / TOKYO ELECTRON Precio #293826424 for sale

TEL / TOKYO ELECTRON Precio is a highly precise, high-speed wafer prober designed for the inspection and testing of semiconductor devices and circuits. It combines the advanced technology of TEL and TOKYO ELECTRON in an integrated prober equipment. It features an array of capabilities that are essential to efficiently manage and accurately characterize device performance. TEL Precio comes with a Probe Positioning Unit (PPU) that is designed for quick and accurate sample placement and exchange. It is capable of up to 100G acceleration and 300mm/sec travel speed, allowing for a wide range of sample sizes and types to be accommodated. The sample position can be monitored continuously during probing via an onboard high-resolution camera, and the system also includes a high-precision encoder for accurate positioning control. TOKYO ELECTRON Precio unit also includes TEL / TOKYO ELECTRON Map Measurement Kit (MMK) that can be customized for specific probing requirements. The MMK consists of a set of needles, test heads, and x, y, and z micrometers that can be integrated into the machine to accurately measure the electrical characteristics of semiconductor devices. The MMK is further augmented by a Micro-Units (MU) diagnostics tool that helps to identify and correct common and difficult-to-find defects on semiconductor devices. Precio is powered by the latest Smart Control Station (SCS) software, which automates the probing process, allowing users to accurately control the device parameters and measurements with precision. It also features a variety of software controls to manage the process and monitor the data during the probing and measurement process. The SCS also provides a comprehensive overview of data acquired during each probing session, allowing users to quickly and clearly interpret results and make comparisons. All in all, TEL / TOKYO ELECTRON Precio is an advanced, highly precise and efficient prober that is designed to ensure accurate performance and efficient probing of semiconductor devices. It offers a wide range of features that allow for precise and efficient testing and analysis to quickly diagnose and troubleshoot complex semiconductor problems.