Used TEL / TOKYO ELECTRON Precio #9207958 for sale

TEL / TOKYO ELECTRON Precio (TPE) is a high-performance probe equipment that is used to measure semiconductor device parameters in a wide variety of applications, including semiconductor wafer fabrication and testing. The TPE features the latest in precision probe technology, making it a reliable solution for a wide range of probing needs. The TPE is configured with dual probe cards with a maximum of sixteen probe pins per card. The system also includes a choice of various probes, depending on the application. These probes can include mechanical probes, conductive atomic force microscopes (AFM), or high-frequency eddy probes. The TPE is also equipped with integrated inter-probe electronics, allowing for accurate and repeatable device characterization in a variety of applications. The unit is controlled by a personal computer using a comprehensive software package that includes automated parameters setting, data acquisition, analysis, and multidimensional data visualization. The software also allows for the implementation of a variety of measurement algorithms and techniques, such as bathtub and sweep curves. This enables precise characterization of electrical and physical parameters of devices. The TPE has a built-in wafer chucking machine, which makes for easy wafer mounting and can accommodate wafers up to 300 mm in diameter. The TPE tool is also configured with a wafer surface imaging asset to ensure accurate placement of probes. The TPE offers a variety of features designed for reliability and actual usage. The model is designed with an automated thermal compensation algorithm to eliminate temperature drifts, and can easily be expanded to include additional probing features. The TPE also supports multiple wafer sizes, probe types, and data rates. Furthermore, the equipment's wafer stage and probe pins are designed with anti-corrosion treatment, making them reliable for repeated use. TEL Precio has proven to be an efficient and reliable probe system, delivering superior performance and reliability in a variety of applications. Its integrated inter-probe electronics, robust probing capabilities, and user-friendly features make it an excellent choice for device characterization and testing needs.