Used TEL / TOKYO ELECTRON Precio #9232739 for sale

TEL / TOKYO ELECTRON Precio
Manufacturer
TEL / TOKYO ELECTRON
Model
Precio
ID: 9232739
Wafer prober.
TEL / TOKYO ELECTRON Precio is a prober that is used to probe the electrical characteristics of semiconductor and other types of integrated circuits. The device features a high accuracy and outstanding repeatability to accurately measure the electrical parameters of a variety of circuits. It is ideal for testing digital, analog and mixed signal ICs. TEL Precio is designed with a 4-axis, high-speed wafer stage that accommodates up to eight 2-inch wafer-carrying cassettes. This stage is driven by an X-Y-Z assembly and precision linear motors to accurately move the test wafers in three-dimensional space at speeds up to 360 mm/sec. The stage is configured with electrostatic chuck (ESC) to ensure the highest repeatability and stability of the stages' position. The system is compatible with 25mm to 300mm diameter wafers and the microscope accommodates both single- and double-sided wafers. The prober is also equipped with the DCC-75 contactor that delivers highly accurate probing with a built-in closed-loop force mode. It is a mechanical arm that presses and tests probes with an accuracy of up to 25µm and a repeatability of up to 4µm. It also features excellent thermal stability with the capability to simultaneously test multiple contacts. TOKYO ELECTRON Precio is powered by the Teltech WAT software which enables users to design, setup and control automated, reliable testing. The software combines advanced engineering and production features such as check scheduling, wafer mapping, statistical process control, graph generator, recipe library and auto feedback to ensure repeatability, speed and higher yields. The device also features a dual-beam digital microscope (DMD) with high resolution and magnification up to 5X to accurately monitor probe-contact quality. The combination of integration, reliability, sophistication and accuracy, makes Precio a prober of choice for semiconductor and other IC testing.
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