Used TEL / TOKYO ELECTRON UF 300 #159390 for sale

TEL / TOKYO ELECTRON UF 300 is an advanced prober for semiconductor process development. This equipment is equipped with a high speed data processor and sophisticated prober design, which allows for the quick and easy testing of wafers and other semiconductor components. The system is comprised of several components, including the Probing Station, Probe Head and Probe Software. The Probing Station is an enclosed chamber which houses the Probe Head and Probe Software. This unit is configured to minimize the bouncing and contact wear that occurs when a Wafer is probed. Integrated into the Probing Station is a high-precision vacuum table which holds the Wafer firmly and securely during the probe process. The table also provides the necessary vertical movement in order to align the wafer to the probe head. The Probe Head is the main component of TEL UF 300 prober, containing a detailed cartographic-style optical comaprison unit with a high-resolution imaging stage. This machine is capable of measuring photomasks with a resolution greater than 10 microns, allowing for accurate and reliable probing. The head also maintains a constant contact pressure during the probing process, ensuring that the connections made with the device under test (DUT) do not suffer from contact degradation or damage, which could cause false readings or connections to be made. The Probe Software, or Probing software, runs on an Intel processor and offers an integrated comprehensive probing suite. This software allows users to pre-scan a wafer to determine the locations of the DUTs and analyze the electrical characteristics of each DUT with high precision. The software also provides a graphical representation of the wafer surface and connections, allowing the engineer to quickly locate any DUTs and connectors which may have been missed. TOKYO ELECTRON UF 300 is a leading semiconductor prober, offering a highly versatile platform for probing and testing semiconductor components. With its combination of high-precision optical comparison, high speed data processor and integrated controlling software, this prober provides a reliable and accurate platform for wafer and device development.