Used TEL / TOKYO ELECTRON WDF #293809340 for sale

TEL / TOKYO ELECTRON WDF is a fully automated 300mm wafer Prober, designed for testing of semiconductor devices. It is an advanced prober and is used for high precision metrology applications. TEL WDF Prober is capable of handling a wide variety of wafer sizes from 4 to 12 inches in diameter. The prober is equipped with an A/FIA prober equipment allowing for precise testing and analysis of a variety of semiconductor wafers. It is designed to handle a variety of testing protocols and provides excellent testing accuracy through calibration sweeps at both ends of each wafer. The A/FIA prober is also equipped with an XY stage system and 3-axis motor controls, allowing for the precise placement and positioning of wafers for testing and metrology. TOKYO ELECTRON WDF Prober unit is also equipped with high-resolution cameras and an automated image recognition machine, allowing for fast and accurate analysis of device features. This tool can be used to identify any defects or non-compliant features across the entire surface of the wafer. WDF is also equipped with an areal particle counter, which can measure the number and size of particles. TEL / TOKYO ELECTRON WDF Prober is also equipped with a laser profiler, allowing for highly accurate measurement of device geometry and surface topography. It is also capable of high-precision measurements of wafer surface roughness. The laser profiler allows the device to be characterized accurately for a wide range of parameters. TEL WDF is also equipped with a programmable head for convenient device testing and characterization. The programmable head allows for easy device testing, in which the head can be programmed to execute and analyze complex test patterns with high accuracy. The programming of the head can be done either manually or automatically. TOKYO ELECTRON WDF Prober is an advanced device that provides excellent accuracy in measuring and testing semiconductor devices. It is capable of handling a variety of wafer sizes, is equipped with an A/FIA, has a flexible XY stage asset, and includes a variety of advanced instrumentation, including a Programmable Head, High Resolution Cameras, and a Laser Profiler. The Prober is highly reliable and provides accurate characterization of device parameters and features.