Used TELEDYNE TAC HAS-500 #293658709 for sale

TELEDYNE TAC HAS-500 is a prober designed for testing wafers used in the fabrication of semiconductor devices. This automated wafer probe station features an advanced design with an extremely high-precision X-Y table for the accurate placement of the wafers on the platen and a high-accuracy Z-axis for precise contact between the wafer and the probes. It also has a high-speed TELEDYNE Multi-zone Heater equipment allowing accurate sample temperature full-field uniform temperature control with low effect on uniformity from environmental temperature variations. The TAC HAS-500 is capable of providing high-speed automated wafer probing with superior quality control. It has the ability to detect and collect data for rapid in-process measurements, providing highly reliable results. The probe station features a high-accuracy electric motor drive system with a minimum travel range of ± 10 um. It can also handle a variety of substrate shapes with an aspect ratio up to 1:9. The TAC TELEDYNE TAC HAS-500 is also equipped with a high-resolution Digital Microscope Unit (DMS) with a 9-megapixel digital camera that allows users to make precise measurements across the entire wafer surface. It also features an embedded Automatic Positioning Machine (APS) that detects coordinates from fiducial marks and accurately controls the positioning of the wafer on the platen, as well as a 4-point or 6-point manual alignment capability. The station also includes a motorized adjustment tool that quickly compensates for variations in substrate thickness. Moreover, the TAC HAS-500 is integrated with a 6-axis manipulator which uses air bearings to achieve high-precision movement of probes for automatic alignment and repeatable fast pick-and-place operations. It is also designed with a built-in automated wafer mapping asset, providing the capability of quickly storing and recalling previously-defined wafer maps. The station also includes a fully-integrated data acquisition model that enables data captured during the wafer probing process to be merged with a database of parameters for each data set. Overall, TELEDYNE TAC HAS-500 is an advanced and reliable wafer probe station designed to provide an efficient solution for accurate testing and probing of lead frames and other substrate devices. Its high accuracy positioning equipment and powerful capabilities enable it to meet the needs of a wide range of high-volume, high-throughput processes in the production of advanced semiconductor devices.