Used TERADYNE 1004 N #9252878 for sale

TERADYNE 1004 N is a probe equipment designed for automated wafer level testing. It has the processing power and speed to enable exhaustive parametric testing of multiple devices in parallel. The system is controlled by a digital computer and remotely operated by a graphical user interface (GUI). It is capable of accommodating wafers up to 3", 4", 6" 8" or larger upon request. The machine has a large storage capacity, which enables it to store over 1000 test vectors. It also has several built-in search algorithms for optimizing parametric testing setups. Furthermore, it includes an advanced fault location tag (FLT) feature which allows it to identify failing sites within a device. The automated prober features a new design for confocal probe card technology. This technology provides improved accuracy during contact probing by focusing the spotting force of the probes. It also ensures low and even electrical contact between the mounted devices and the test head. The unit is designed with several safety features to protect the device from thermal stress and physical damage. The prober has a mechanical program that assesses contact forces to prevent routine mechanical stress and drift. It also has an electrical program to prevent excessive electrical leakage when testing complex or high-voltage devices. For measuring parametric data during the test process, the prober supports a variety of measurement techniques such as time domain reflectometer (TDR), capacitance-voltage (CV), source and drain capacitance (SCR) and others. It is also capable of data previewing and graphical sheet generation. 1004 N is also capable of providing detailed real-time feedback on test results. It allows for a range of waveforms to be stored for further analysis in case of a failed test. This enables engineers to quickly identify and pinpoint the source of a failed test. In summary, TERADYNE 1004 N is an advanced prober machine designed for automated wafer level testing. It offers an efficient and reliable platform for testing all kinds of electronic devices quickly and accurately. It features an advanced confocal probe card technology, several safety features and powerful measurement techniques, as well as real-time feedback on test results.