Used TERADYNE ESI-1004N #9216191 for sale

TERADYNE ESI-1004N Prober is an advanced high accuracy, high throughput automated semiconductor test and analysis system. It is designed to accurately test, troubleshoot, and diagnose integrated circuits (ICs) during their development and manufacture stages, helping to ensure their reliability and performance. ESI-1004N offers a comprehensive range of probing characteristics, enabling users to obtain data-rich analysis along with rapid and efficient operation. TERADYNE ESI-1004N integrates a 4-axis gantry and 1 mm standoff capabilities, providing a high degree of precision and accuracy as well as improved results. Its touchscreen displays feature a user-friendly interface and support latching operations, enabling different types of testing operations to be efficiently conducted. The prober is equipped with an independent up-down X-Axis, driven by a vibration-resistant and precise linear bearing. It offers z-height and variable pressure control as well as an auto-tuning program, while an adjustable focus and magnification system provides users with an accurate view of sample layouts. ESI-1004N is capable of testing and analyzing a variety of prototype and mass-produced ICs, such as flash memory and microprocessors. Its CCD-based optical resolution can detect features as small as 0.4 microns, and its tight alignment repeatability helps to minimize yielding losses. In addition, the prober features automatic focusing and tool management, saving users valuable time. Its software includes debugging and CCD imaging functions, and can be used to extract information from specific features. It also includes advanced statistical analysis functions, which are used to identify weak and faulty components. The system meets a variety of rough handling qualifications, guaranteeing its long-term reliability and durability. Its space-saving design makes it easy to install and use in production lines, while its quiet operating noise levels minimize disruptions. TERADYNE ESI-1004N is a highly valuable tool for IC test, analysis, and debug, delivering significantly improved results and reducing production costs.