Used TERADYNE ESI-1004N #9246707 for sale

TERADYNE ESI-1004N Prober is an advanced test and measurement equipment designed to provide a comprehensive solution for probing integrated circuit (IC) packages. ESI-1004N Prober is a self-contained, advanced prober with a 25 cm2 automated motorized wafer stage, allowing for automated wafer handling and probing operations. It is capable of performing both single and multi-site probe operations with 400 MHz frequency response and accurate Z-axis servo control. This prober provides enhanced throughput with automated platform recipe programming, fixed stage alignment, and advanced wafer mapping and probing techniques specifically designed for high frequency device testing. TERADYNE ESI-1004N Prober is equipped with an advanced electronic test head which offers maximum precision and repeatability for the most demanding test requirements. This test head utilizes multiple couplers to support up to 128 digital inputs and outputs and 4 capacitive touch-down pads for the most demanding electrical test applications. Additionally, the test head includes a fine parameter setting adjustment feature, allowing for finer more accurate control of test parameters. ESI-1004N Prober is equipped with an advanced signal integrity system, providing optimized alignment and calibration for high power digital testing. The advanced signal integrity unit utilizes 4 dedicated calibration sensors within the prober head, offering superior high frequency performance. The signal integrity machine also offers advanced thermal management, providing stable temperature control for superior long-term performance. Furthermore, TERADYNE ESI-1004N Prober is equipped with a highly efficient vision tool which is designed to perform extreme precision and repeatability for standard and MEMS packages. This vision asset offers features such as barcode scanning, package identification, angled visioning, thermal imaging, and laser measuring. The vision model is integrated with a powerful imaging processor and vision library for further customization and programmability. In addition, ESI-1004N Prober includes TERADYNE Probe management software which provides a wide range of equipment diagnostics and optimization tools. This software offers a comprehensive graphical user interface, allowing for easy operation and setup of TERADYNE ESI-1004N Prober. All system data logging functions are accessible through the intuitive software interface, allowing for improved efficiency when controlling complex tests. ESI-1004N Prober is designed to reduce time to market and improve wafer yield for complex applications. This advanced automated prober unit provides enhanced throughput, accuracy, and repeatability through automated wafer handling and testing operations. TERADYNE ESI-1004N Prober is a comprehensive testing platform designed to deliver exceptionally precise and repeatable results for the most demanding test needs.