Used TERADYNE Javelin 1004 / ESI-1004 #9090436 for sale

TERADYNE Javelin 1004 / ESI-1004 prober is an automated, high-performance, high-accuracy solution for probing a wide variety of semiconductor devices. It features a high-frequency, robust wafer handling system, capable of scanning and testing dies in both cassette-to-cassette (C2C) and strip-to-strip (S2S) configurations at speeds up to 15 kHz. Javelin 1004 / ESI-1004 prober's advanced platform utilizes an innovative 3D head-positioning technology enabling adjustable head-height and pitch angles, along with rail-elevation adjustments to provide superior accuracy in a compact footprint. This unique combination of features enable high-precision results and yields over a wide range of materials, widths, and pitches. TERADYNE Javelin 1004 / ESI-1004 prober's versatile design allows for characterization of a wide range of semiconductor devices, including its high-capacity test cell that can accommodate 2- and 3-leaded high-pin-count devices. A side-looking device tester, offering a wide range of application-specific locator heads, is also available for specialized testing applications. Javelin 1004 / ESI-1004 prober provides an ideal solution for manufacturing high-cadence characterization, including burn-in and wafer level validation. An integrated envelope-protect probe system enables users to efficiently characterize devices at various temperature ranges while avoiding damage to sensitive substrate materials. TERADYNE Javelin 1004 / ESI-1004 prober is well-suited for integrated circuit (IC) manufacturers and is a durable, plug-and-play solution capable of accommodating a range of IC devices, test cell configurations, and various wafer sizes. It provides easy-to-use automation software, controller button interface, advanced precision laser- and camera- based vision systems, and automated alignment methods. This combination of features gives users the flexibility to conduct efficient, error free characterizations. In summary, Javelin 1004 / ESI-1004 prober is an ideal solution for high-performance and high-precision characterization applications. It features a robust wafer handling system, adjustable head-positioning technology, high-capacity test cell, versatile design, and comprehensive automation software, making it a comprehensive, cost-effective choice for probing a variety of semiconductor devices.