Used TERADYNE Javelin 1004 #9383190 for sale

Manufacturer
TERADYNE
Model
Javelin 1004
ID: 9383190
Flying prober (2) Heads.
TERADYNE Javelin 1004 is a high-precision, automated prober specifically designed for testing of low-pin-count devices. It is a compact and modular instrument that enables users to quickly and accurately test various types of semiconductor components. Javelin 1004 offers a range of capabilities and features, including a fast probing cycle of 2.5 milliseconds, a 64-probe or 128-probe multiple probe head, a compact footprint, an intuitive graphical user interface (GUI) and programmable automation. TERADYNE Javelin 1004 also features an advanced calibration system, which helps ensure accurate measurement of low-pin-count devices. Additionally, its micro-positioning capability and differential-movement feature ensures reliable results. Javelin 1004 can be programmed to test any combination of settings, such as pin-outs, gain, offset, frequency response, and temperature-dependent parameters. Additionally, it provides betther probing accuracy than most manual probers by using a differential-movement technology that compensates for prober movement or environmental vibration. TERADYNE Javelin 1004 supports a variety of substrate technologies, such as ceramics, LTCC (Low Temperature Cofired Ceramics), FR-4, and flex. It is also designed for low-frequency characterization up to 1 GHz. Test probes can be coaxial, capacitive, or banana-tip varieties, with a recommended spring force of 0.2N. Javelin 1004 also has a precision-repeatability rate of 0.5 µm across its entire measurement range. TERADYNE Javelin 1004 can be equipped with additional probes to facilitate multiple simultaneous measurements. It also has built-in security features to protect against unauthorized access. In addition, Javelin 1004 is compatible with all of the most popular software packages used to program and execute automated tests. In short, TERADYNE Javelin 1004 is a versatile and reliable automated prober specifically designed to test low-pin-count devices. It integrates advanced calibration and micro-positioning systems with a high-speed prober cycle and easy-to-use graphical user interface that enable fast and accurate testing results.
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