Used TERADYNE Javelin ESI-1004N #9364371 for sale

Manufacturer
TERADYNE
Model
Javelin ESI-1004N
ID: 9364371
Vintage: 2000
Flying prober inline tester Circuit board inspection system Does not include: Computer Hard Disk Drive (HDD) Power supply: 200-220 V, Single phase, 50-60 Hz, 30 Amps CE Marked 2000 vintage.
TERADYNE Javelin ESI-1004N is a high-performance semiconductor prober designed for wafer probing and electrical characterization of various electronic devices. It is ideal for high-volume and quality-sensitive production testing. The prober has a variety of features that make it suitable for a wide range of applications, including high-speed data acquisition, precise positioning and alignment, and flexible probing and testing solutions. Javelin ESI-1004N offers a robust, modular design with advanced features for probing, testing and fault analysis. It includes an intuitive user interface and control software, allowing for efficient setup and operation. The prober is equipped with four tool stools for maximum flexibility in accommodating various probes, test cards, chucks, tweezers and other tooling. It also features a 4-axis motorized stage with a maximum speed of 12.5 millimeters per second, providing fast and accurate positioning. The prober also features a custom-designed waffle-integrated prober solution, optimized to support a wide variety of 300 mm prober load frames and fixtures. In terms of data acquisition, TERADYNE Javelin ESI-1004N includes a high-speed TSI Acquisition module and a multi-channel per tester module, delivering fast, accurate and reliable signal data. In addition, the prober supports a variety of probing technologies, including DC current, DC voltage, resistance, capacitance, inductance, resistance-plus-capacitance, pulse-width modulation, frequency response, voltage level control, and many others. Javelin ESI-1004N also provides an advanced imaging module for wafer automated optical inspection (AOI) and thermal imaging. This module offers high-resolution images, various sensor filters and a wide variety of illumination sources. In addition, the prober includes a 3D module for precise 3D shape profiling and height measurements. TERADYNE Javelin ESI-1004N also provides an integrated packaging and component loading solution, making it ideal for performing advanced tactile inspection and defect analysis. The system features various advanced packaging capabilities, including vision-guided component placement, product verification, stacking, and surface-mount assembly. With its flexibility and variety of features, Javelin ESI-1004N is an ideal solution for high-volume testing, electrical characterization, and fault analysis. It offers fast, precise and reliable performance for a variety of applications, making it a great choice for quality-sensitive production lines.
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