Used TOKYO SEIMITSU UF50 #9172909 for sale

TOKYO SEIMITSU UF50 is a high-precision, motorized vertical and horizontal prober designed specifically for semiconductor on-wafer measurement testing. Its precision resolution and motors make it ideal for use in high-reliability semiconductor measurement applications. The prober consists of a prober head, a probe stage, a prober rail, a prober base, a controller, and an optical microscope. The prober head includes two high-precision linear motors which control the two dimensional (X,Y) movement of the probe stage in order to position its touch probe. The vertical movement of the probe stage is controlled by a precision linear motor inside the prober head. The probe stage is mounted on a precision rail equipment, which allows for smooth scanning in the Z-direction (vertical) and rotational motion in the XY-plane. The prober head is mounted on the prober base which provides the structural support for the entire system. UF50 utilizes a 4-corner micro-positioner mechanism and laser alignment unit integrated in the prober head. It has the capability to accurately measure the tilt and rotation of the test wafer with an excellent repeatability. The prober also supports a standard or custom-designed fixture on the probe stage. This feature allows the user to probe multiple sites and execute complicated probing patterns, making it suitable for high-throughput probing. The prober is equipped with a high-resolution CCD camera machine and supporting software. The CCD camera captures the images of the test wafer and reports the measurements for further analysis by the controller. The controller offers a variety of software options, such as High-Level Programming Language (HLL), which allows for a variety of operations to be performed with the prober. TOKYO SEIMITSU UF50 is highly reliable, lightweight and portable. It is designed with a modular structure, allowing users to upgrade modules as needed. This feature increases the life span of the prober, as it can be simply upgraded without replacing the entire unit. The prober offers users a range of test functions, including thermal characterization, durability testing, and exposure testing. This makes it suitable for a variety of applications such as semiconductor manufacturing, quality assurance, and failure analysis.