Used TSE / MPI LEDA-8F 3G Plus-VDB #9156775 for sale

TSE / MPI LEDA-8F 3G Plus-VDB is an advanced prober designed to simultaneously test samples up to 8x8 millimeters (mm) with its 8-pad, 100µm resolution probing equipment. This tool is optimized for quick and reliable VCSEL (Vertical Cavity Surface Emitting Laser) testing that requires short distance probing and better yield performance. The tool also offers fast sample loading and unloading support for high-throughput production. TSE LEDA-8F 3G Plus-VDB prober is designed with an integrated vertical wafer load system that simplifies the wafer handling process, reduces mechanical wear, improves unit stability, and ensures fast and accurate sample loading. The prober is also equipped with an 8-pad test head, delivering an accurate and reliable data capturing and positioning accuracy when testing laser samples. Built with an ergonomic design, the tool has a minimal footprint and allows quick responding for rapid test cycles and high throughput. In addition, MPI LEDA-8F 3G Plus-VDB prober is equipped with high flexibility for uncomplicated test cell integration, optimum production of high volume products, fast test times, and improved yield rates. Its standard software platform comes with Graphical User Interface(GUI) and allows users to develop and save numerous parameters to provide a higher level of operation with a comprehensive range of machine configurations. It also offers an exclusive selection of add-on options for multi-function capabilities such as wafer orientation systems, third-tier component handling, and LED/TFOCA or MC connectors. LEDA-8F 3G Plus-VDB prober is widely used for probing and testing of high-end optoelectronic and semiconductor lasers for Aerospace, Automotive, Military, Medical, Industrial, Telecommunications, and even Consumer electronics. With its powerful testing capabilities, the prober helps significantly reduce the risk of defects in production samples and offers a cost- effective solution for permanent test sample validations.