Used TSE / MPI LEDA-8F 3G #9181633 for sale

TSE / MPI LEDA-8F 3G is a prober used in the manufacturing and testing process of semiconductor devices. It is equipped with a powerful industrial PC, allowing for precise probe test measurements in an automated environment. The equipment also features the latest probe card technology, offering superior repeatability and accuracy with every test cycle. The main components of TSE LEDA-8F 3G featured include a space motion system, controller, tester, general purpose interface bus (GPIB), digital ethernet, and an automatic prober. The space motion unit consists of a 3-axes linear drive with 6-axes linear positioners, and an encoder machine that tracks the prober's exact position. This tool can support multiple probe cards, enabling quick, yet accurate testing. The controller is a multi-core processor that utilizes LINUX operating systems and provides highly-intuitive software control. This allows for higher speed data processing at the point of testing without the need for an external test PC. It also enables MPI LEDA-8F 3G to provide more complex test languages to meet the testing requirements. The tester is a high-speed digital tester suitable for most test applications. It can perform a wide range of tests, such as multi-channel digital, analog, electro-mechanical, and custom tests. The tester is also capable of providing DC and AC test signals. In addition, the programmable tester can generate blank waveforms so that new devices can be developed without requiring new patch cables. LEDA-8F 3G also comes with a GPIB for remote connections. This allows for TSE / MPI LEDA-8F 3G to be connected to external test systems such as semiconductor wafer testers. Moreover, a digital ethernet connection is provided, which allows for high-speed data transmission between pieces of equipment. Finally, TSE LEDA-8F 3G is equipped with an automatic prober built with a 5-axis servomotor control asset. This allows for a precise and fast movement of the tester and makes automated testing possible. The model is capable of testing both wafer and tray level devices, making it suitable for many testing needs. MPI LEDA-8F 3G prober is the perfect solution for manufacturers and testers in need of a reliable, efficient testing solution. With its superior accuracy and repeatability, high-speed remote testing, and automation capabilities, it offers a variety of ways for businesses to increase production and improve test quality.