Used TSE TPS7 #9143294 for sale

TSE TPS7 is a prober specifically designed for testing integrated circuits under thermal stress. It is an ideal choice for testing high power VLSI and 3D chip designs. TPS7 is an advanced thermal profiler with a wide range of features and capabilities. TSE TPS7 has an integrated compact floor-mounted design and includes a high-speed thermocouple and precision scanning capability for sequentially measuring the thermal properties at high probe densities. With its high accuracy and reliability, TPS7 is ideal for a variety of IC testing applications. TSE TPS7 is equipped with a highly sensitive non-contact infrared camera capable of detecting thermal gradients and temperature changes as small as 0.1°C, and a high resolution digital camera for precise imaging of test samples. The machine's data acquisition and logging system can process up to 30,000 measurements per second for a broad range of temperature testing and characterization. TPS7 also features a unique high-accuracy RTD to measure temperature variation and calculates composition ratio. This advanced prober includes an integrated thermal measurement package, a precise temperature controller, and a precise thermal gradient measurement function. Additionally, TSE TPS7 offers precise thermal mapping, allowing engineers to map and analyze the temperature distribution in various ICs. TPS7 features a fast, repeatable temperature profile triggered by the user, with a test modifiable time range of up to five seconds. Moreover, the machine offers multiple user-defined averaging schedules, so that users can quickly measure complex thermal parameters. TSE TPS7 also offers a wide-area data logging, which records the thermal data across multiple locations. Additionally, the prober supports up to eight externally-measured thermocouple channels for additional thermal sensing. TPS7 is a powerful prober for advanced testing and characterization of integrated circuits. Its integrated system offers precise thermal testing and mapping for a broad range of ICs, and provides reliable data for rapid and accurate characterization. The machine offers an outstanding performance, accuracy and reliability for complex IC testing requirements.