Used TSE TRP7000 #9204282 for sale

TSE TRP7000
Manufacturer
TSE
Model
TRP7000
ID: 9204282
Wafer Size: 6"-8"
Prober, 6"-8" Maximum temperature measurement: 120° C (8) Para testers (8) Chips.
TSE TRP7000 is a multi-function prober designed for testing and analyzing integrated circuits on wafers, probes or other carriers. It enables fast, efficient and precise probing and troubleshooting of circuits at the wafer level. With its advanced multi-probe technology, TRP7000 can quickly probe multiple contact points simultaneously and at high speed. The prober's design includes an integrated optical system which allows it to capture sharp images of test points for high-speed analysis. TSE TRP7000 is equipped with a multi-axis scanning system, providing high speed and maximum flexibility. It can scan both rigid and flexible body probes in any direction and at any angle allowing for accurate probing. The prober has a high-resolution camera that is able to detect extremely small features and can image probes and test points simultaneously with high resolution. The prober is also equipped with software that can analyze probes and test points and provide automated diagnostic and troubleshooting information. The software includes features such as defect analysis, advanced optical shape recognition, and signal analysis. This allows TRP7000 to quickly detect and analyze any problems with a circuit and provide the information needed for corrective action. The prober is also capable of collecting detailed circuit data up to 5GHz and features a large modal field emmitte. This provides the prober with precise readings and measurements of devices in a wide range of operating environments. TSE TRP7000 features a modular design, allowing for easy maintenance and repair. It can be configured to use up to four probes for testing and has a variety of tools available to improve testing efficiency. It is also compatible with different kinds of probes and is capable of using non-contact probes for high-resolution imaging. TRP7000 is a powerful prober that provides efficient testing and analysis of complex circuits. It enables fast, precise probing and diagnostics of small test points with a high level of accuracy and reliability. The software, combined with its advanced multi-probe technology, enables it to quickly identify and analyze any potential issues in devices or circuits. With its means for reliable analysis and rapid troubleshooting, TSE TRP7000 is an ideal choice for studying integrated circuits and troubleshooting wafers.
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