Used VEECO / DEKTAK AP 150 #161937 for sale

VEECO / DEKTAK AP 150 is an advanced scanning prober with excellent positioning and repeatability performance. It offers superior performance to its predecessor, the AP100, with a much higher accuracy of five nanometers, enhanced Z-axis travel, and reduced noise levels. VEECO AP 150 is an advanced scanning prober designed for a wide range of semiconductor research applications including failure analysis, thin film metrology, and surface characterization. It is engineered to provide excellent positional accuracy and repeatability performance for improved process control. The prober features an integrated scan head, high-resolution rotary encoders, a parallel positioning stage, and a Z-axis travel of up to 50mm. The equipment is powered by a high-speed motion control system to provide precise motion control of the stage, while a range of vision and precision motion control options are available to customize the prober to specific tasks. DEKTAK AP-150 has a high-quality, low noise design that offers notable signal-to-noise ratios for improved accuracy and sensitivity. The signal conditioning circuits are optimized to provide better detection and lower power consumption. To facilitate flexibility, the prober is designed to be compatible with both AWG 2 and AWG 3 probes via an integrated adapter. The prober also offers a highly accurate scanning head to ensure that pattern placement is exact. The head has X, Y, and Z axes with automated chip position and a resolution of five nanometers. The optical feedback unit makes positioning faster and more precise than before. AP 150 also features an optional media rack machine that allows for a variety of sample media such as substrates and masks. This rack tool is equipped with a vacuum asset to ensure sample stability during testing. For enhanced flexibility, the prober has a range of vision and motion control options, including FORTH programming, 12-bit camera support, and a 14-bit digital encoder. Overall, DEKTAK AP 150 is an advanced scanning prober that provides excellent performance for failure analysis, thin film metrology, and surface characterization. The prober has five-micron accuracy, enhanced Z-axis travel, and low noise design for improved sensitivity. It is designed with a range of vision and motion control options to facilitate greater flexibility and a media rack model for a variety of sample media.