Used WENTWORTH 0-043-0001 #9196410 for sale

WENTWORTH 0-043-0001
Manufacturer
WENTWORTH
Model
0-043-0001
ID: 9196410
Wafer Size: 4"-8"
Prober,4"-8" Lamp Wafer Chuck TEMPTRONIC TP03000A-2300-1 Parts machine.
WENTWORTH 0-043-0001 is a multi-purpose prober that is used in a variety of semiconductor, medical, and industrial settings. It has the capability to probe a range of sizes from as small as 0.1 mm to as large as 40 mm. The probe offers superior accuracy compared to other conventional tools and its tip size is adjustable for multiple probing applications. 0-043-0001 is an advanced prober designed with features such as low-level probing, dynamic frequency response, high-frequency transmission, and multiple conductivity options. It is designed with an enclosed housing structure to provide noise isolation from the environment and protect the internal components. The prober is equipped with an automatic vacuum relief and warm-up countdown system to ensure that the probe tip is correctly set for measurement. WENTWORTH 0-043-0001 features an intuitive control panel with an LCD display, push-button operation, and on-screen programming to simplify set-up and calibration. Its advanced auto alignment feature automatically adjusts the probe's tip to target the sample under test, saving time and money. The prober is equipped with a variety of interchangeable tips to cover the entire probe range and perform various tests. The prober also features a tweezer adapter to allow precise placement of miniature components. Additionally, the prober is designed with an isolation ring around the probe head to eliminate electrical contacts, which minimizes interference from outside sources. 0-043-0001 has durable construction and components that provide reliable operation under a range of operating temperatures and vibration levels. With its superior accuracy and reliability, the prober is perfect for laboratory and industrial environments. Its large range and flexible programming capabilities make it suitable for various probing requirements, from simple testing to complex measurements.
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