Used WENTWORTH CMP-100 #114331 for sale

WENTWORTH CMP-100 is a prober designed for the testing and probing of silicon integrated circuit devices. This tool uses low-k dielectrics, bonded aluminum, C4s, and BGA solder balls for testing and probing of advanced semiconductor devices. CMP-100 utilizes a combination of advanced technologies in order to precisely control each probes' travel as well as to accurately apply the required voltage and current levels to the devices under test. WENTWORTH CMP-100 is equipped with a unique, high-accuracy, low-k dielectric (LKD) material that provides various benefits regarding signal traceability, signal branching, and device imaging. This material has been developed to address the ever-increasing complexities of integrated circuit designs and allows for higher accuracy in signal signal traceability and propagation. Additionally, the LKD material also produces signal branching and device imaging results that can be more accurate than other probers. This prober is also capable of probing devices with different BGA solder ball pitches with an accuracy of up to 2.5 microns. CMP-100's high accuracy and calibration capabilities allow for the most precise probe positioning, thus resulting in the most accurate testing results possible. WENTWORTH CMP-100 also features an advanced C4 technology that enables fast efficient electrical probing of multilayer/complex components as well as a bonded aluminum technology which allows for the quick, efficient probing of harder to reach locations. In addition to its precision and accuracy, CMP-100 also features a variety of safety features, such as over-protection circuitry, that prevent damage to the devices under test. Additionally, WENTWORTH CMP-100 also has various user-friendly features, such as a user-friendly interface and a robust, expandable test system. These features make CMP-100 a valuable tool in the testing and probing of advanced devices.