Used WENTWORTH MP-1000 #9234851 for sale

WENTWORTH MP-1000 Prober is a smart and reliable automatic wafer prober integrated with fully-automated process control as well as real-time process monitoring. This comprehensive equipment enables highly accurate probing of semiconductor wafers and dies, with minimized variation between probing results initiated from a single sample. The system features a fully automated work chamber, which can accommodate changes in product data, reducing the possibility of manual errors. Furthermore, the chamber's work area is protected by a custom-designed hood to create an ergonomically safe and clean work environment. MP-1000 includes state-of-the-art hard and software that provide powerful resources for wafer and die/contacts probing and testing. The machine tools are integrated with robotic placement, automatic alignment, and automatic loading/unloading of cassettes/boats. It features an automated cleanroom grade ESD-Safe chamber unit, including forced air-flow environmental control. Additionally, operation is facilitated by means of a console with the graphical user interface that provides control of the probe, graphical display of the wafer-diagram and process/debugging data, as well as two monitor video displays. The prober is equipped with wafer main probes and test head module for individual wafer contact testing. The probes being used are EP‐10, EP‐15, HEPC‐15 and Z axis with drop/bounce test and Membrane Test. The probes have reduced noise, drift and have good repeatability. The wafer is automatically aligned using a precision stylus alignment and then identified electronically when placed in the prober. Additional features such as position sensitive detectors (PSD) and optical positioning of probes ensure accurate placement of the probes on the wafer. The prober is capable of testing memory devices, logic and mixed-signal products, while delivering accurate and reliable results. The comprehensive complete solution includes integrated software with special functions such as closed-loop wafer move functions, zeroing to substrate per device, variable gain circuitry, contact resistances, and chip-pin map. It is a highly accurate and versatile test machine that will help provide reliable products with reduced turn-around-times.