Used WENTWORTH MP-2000 #293795212 for sale

WENTWORTH MP-2000 is a powerful and highly accurate prober designed for testing integrated circuits and other small components. It is capable of testing a wide variety of device types including flip chips, QFPs, BGA and CSP devices, miniature transistors, resistors and capacitors. The prober is equipped with a precision nano-scale measurement stage, capable of measuring devices within one nanometer accuracy, and a high-resolution imaging system for detailed analysis. MP-2000 is equipped with automated device probes made from advanced wear-resistant materials, designed to ensure reliable connections even under extreme conditions. It offers a high speed non-contact electrical testing feature, which allows for rapid testing of devices and supports a wide variety of contactless data analysis protocols. The robust automated measurement system provides accurate characterization of in-situ electrical measurements including voltage, current and resistance. It is also equipped with an advanced pattern recognition algorithm, allowing for fast and accurate identification of device patterns. In addition, WENTWORTH MP-2000 has an intuitive user interface and comprehensive control software, featuring both manual and automated operation modes. It also has built-in storage for data logging and analysis, and supports a variety of protocols for data exchange, such as I2C, SPI and CAN. MP-2000 is capable of testing up to 2.5 Gbps, which is well suited for testing high-speed devices, such as high-speed memory devices. The prober is also designed for easy integration into production line testing systems, and supports a wide variety of device handler platforms. In addition, WENTWORTH MP-2000 is provided with comprehensive support documentation and software updates, designed to ensure optimal performance. It is noted for its high reliability, and is capable of operating at temperatures ranging from -20°C to 70°C. To summarize, MP-2000 is an advanced and highly precise prober, capable of testing a wide variety of device types to nanometer accuracy. It is equipped with reliable automated device probes and a high-speed, non-contact electrical testing feature. It also has an intuitive user interface and comprehensive control software. Finally, the prober is designed for easy integration into production line testing systems, and is noted for its high reliability and accuracy.