Used WENTWORTH SPV-200 #9183166 for sale

WENTWORTH SPV-200 is a high-precision, multi-purpose prober designed for advanced characterization of semiconductor devices. It is a modular equipment comprised of a force stage, scanner controller, prober head, and tip-drive unit which allows for large area probing or focused probing of individual devices in a wide range of layouts. This makes SPV-200 ideal for pinpointing device parameters as well as for making precise quality control measurements of finished assemblies. The force stage (or motion controller) is the core of the system and delivers highly accurate blasting and contact forces. It also offers repeatable stage motion with high linearity, making sure that the tip-drive unit follows consistent paths when taking measurements. Furthermore, the wide variety of force stages available for WENTWORTH SPV-200 allow for a customizable unit configuration depending on the application. The scanner controller is an integral component in SPV-200 machine. It controls the stage motion and ensures that precise contact and blasting forces are applied to the target device. Furthermore, the scanner controller helps synchronize the other components of the tool, allowing for rapid data capture and accuracy when assessing different devices. The prober head is another important component of the asset. It is designed to position the probe, which can be either a spring-loaded electric contact or sharp needle contact, to specific components in the device. Furthermore, the prober head can move the probe in a lateral "X" and rotational "Y" motion to map the device's layout as well as provide feedback to the scanner controller. Finally, the tip-drive unit is the last portion of the model. It is used to drive the prober head and provide the necessary scanning force. This can either be high-force blasting or low-force probing. Furthermore, the tip-drive unit can support both single- and double-ended scans, allowing for a complete scan of a device layout. In summary, WENTWORTH SPV-200 prober is a sophisticated, modular equipment that is designed to cover a wide variety of applications while ensuring precision and accuracy. Its various components combine to make an ideal tool for quality control measure and semiconductor device characterization.