Used YOKOGAWA E802-074 #293659117 for sale

YOKOGAWA E802-074 is a full-featured, low-cost, high-performance wafer prober designed to meet the needs of cost-conscious semiconductor manufacturers. This equipment features excellent stability and reliability, offering an ideal solution for a wide range of applications from semiconductor device testing, to wafer sorting and cutting. The system is built with an advanced double chuck unit featuring five degrees of freedom. This provides precise, repeatable four-point sample location and two-dimensional alignment that allows for consistent results across a broad range of wafer sizes. Additionally, the combination of two independent X-Y-Z axes and the ability to mount both chucks in any orientation ensures precise sample centering as well as sample centering over multiple wafer locations. In addition to the five degrees of freedom, this machine features a two-stage hot plate designed to improve sample protection. The first stage performs an even and uniform sampling while the second stage ensures a safe and gentle heating of the sample. This hot plate also offers an optional programmable wafer holder for accurately positioning wafers in the prober. E802-074 is capable of testing 100-200mm wafers with a z-height measurement resolution of 0.02 mm. It is also equipped with a built-in parametric and functional test tool, making it easy to set up and configure test parameters. This asset also features an optional signal switch card which allows for full signal routing and switching, enabling a one-connect-to-all signal routing solution. Finally, this model is compatible with many laboratory automation systems, making it an excellent choice for integration into a wide variety of applications. It is also compatible with a range of accessories, including a wafer cleaning station, signal tester, sequencing software, and wafer stage wafer chuck for temperature control. YOKOGAWA E802-074 prober is a powerful, versatile equipment that will meet the needs of both general and specific semiconductor testing purposes.