Used SONOSCAN C-SAM Series D-9000 #9162832 for sale

SONOSCAN C-SAM Series D-9000 is an advanced acoustic microscopy equipment designed for nondestructive micro-scale imaging and analysis of materials. Utilizing ultrasonic waves that are transmitted and reflected from sample materials, C-SAM creates high-resolution, three-dimensional images that reveal detail far beyond the limit of traditional optical microscopy. C-SAM Series D-9000 microscope consists of several key components, including a wide-field acoustic detection system, an electromechanical scanner, a digital signal processing (DSP) unit, and a visual display unit, which facilitate the collection, processing and visualization of ultrasonic imaging data. Its wide-field detection unit uses piezoelectric transducers that convert acoustic energy into electrical signals, allowing for the acquisition of information from large volumes of material. The electromechanical scanner uses a variety of combined x-y-z motion techniques to precisely select points where the transducers are placed. The DSP unit is used to process incoming acoustic data from individual acoustic locations, as well as to measure signal-to-noise ratios and other parameters such as image resolution. It contains a powerful signal processor, a frequency synthesizer, a 3D data acquisition machine, and a selection of imaging modes. SONOSCAN C-SAM Series D-9000 microscope can be used for a wide variety of inspection applications, including high-resolution imaging for applications in materials testing, microstructural analysis, failure analysis, and reverse engineering. Its acoustic imaging capabilities are further enhanced by the ability to view the sample data in cross-section mode, allowing for the analysis of volume data. The C-SAM's advanced imaging technology helps to ensure accuracy and reliability in the inspection of microstructural features by providing detailed information on the composition and structure of materials. It also offers a wide range of imaging modes, from microscope imaging to macro-view scanning, allowing researchers and engineers to investigate and analyze various aspects of material properties.