Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 6420 #9230228 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 6420 is a high performance, mid-range UV-VIS spectrometer that delivers excellent accuracy and precision in the measurement of sample reflectivity. This spectrometer enables reliable characterization of samples in wavelength ranges from 190-1100nm with a resolution as low as 0.2nm and an accuracy of up to ±20 parts per million. HP 6420 provides a variety of analytical capabilities with the capacity to simulate light sources and perform luminescence measurements. Working with a UV-VIS source the instrument is capable of measuring photovoltaic performance and properties, plus there is a unique feature to measure the fluorescence of samples. Additionally, AGILENT 6420 is supplied with a fast scanning Deuterium/Tungsten-Halogen Beam Switcher that enables fast, consistent, and reliable measurements across a wide range of wavelengths. It also boasts a wide dynamic range with an adjustable integration time from 0.5ms to 3600s. This allows measurements over a large dynamic range with high accuracy. KEYSIGHT 6420 is a reliable, stand-alone instrument with an intuitive graphical user interface that allows researchers to configure, control, and operate the spectrometer independently. It also features long-term stability, easy calibrations, plus robust data security with both position encryption and 256-bit Triple Data Encryption Standard (3DES). 6420 is also designed to provide reliable results in the laboratory and is suitable for a range of industrial and field applications. This spectrometer is outfitted with built-in Ethernet interfacing and has a built-in, optically transparent sample compartment, providing powerful sample throughput. The instrument comprises the latest technologies and hardware to guarantee the highest levels of performance every time. To put it simply, HEWLETT-PACKARD 6420 is a reliable, high performance spectrophotometer specifically designed for laboratories and industrial environments looking to achieve excellent accuracy and precision in the measurement of sample reflectivity.