Used BRUKER-AXS Apex II #9258266 for sale
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ID: 9258266
Vintage: 2008
X-Ray Diffractometer (XRD)
With CCD detector
KAPPA Geometry
LYTRON Chiller included
(2) Sources:
Water cooled (Mo)
Air cooled (Cu)
2008 vintage.
BRUKER-AXS Apex II spectrometer is a high-performance, multi-dimensional X-ray instrument designed for advanced diffraction and analytical applications. The system utilizes a combination of modern technology, including a high-resolution imaging detector, a rotating anode X-ray source, and micro-processor based data acquisition and analysis software. Apex II features a wide range of operational capabilities, from static X-ray diffraction to advanced stress-measurement and surface-structure analysis. The instrument has exceptional flexibility due to its interchangeable X-ray source, monochromator, and detector components. It supports up to three interchangeable X-ray sources, such as an incandescent as well as two rotating anode tubes. This allows users to conveniently adjust the wavelength range and the angular resolution of the instrument. The imaging detector supports both imaging and diffraction applications. It can be adjusted to collect pixel data as low as 0.1 mm in size. This allows researchers to gain greater insight into the crystal structure and other physical properties of the material under study. The angular resolution of the instrument can be adjusted on the fly without having to reposition the sample as well. BRUKER-AXS Apex II is equipped with a micro-processor based data acquisition and analysis software that supports multiple modes of operation, such as peak search, peak fitting, and complex pattern recognition. It also features a tightly coupled sample changer that can rotate, shake, and move samples quickly and easily. This allows users to conveniently analyze even the most challenging structures in the material. Finally, Apex II operates in an environmentally friendly manner with an energy saving design that improves efficiency and reduces noise. All these features make BRUKER-AXS Apex II a powerful and versatile tool for advanced X-ray diffraction and analytical research. It offers unparalleled control and precision over material sample analysis, enabling researchers to gain greater insights into the crystal structure and other physical properties of the material.
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